More than 30 general and advanced AFM modes are supported by the NT-MDT AFM providing extensive information about the sample’s physical properties. Simultaneous optical measurements of the same sample area provide the widest range of additional information about the sample.
Integration of AFM with confocal Raman/fluorescence microscopy is of a special interest. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).
Specially prepared AFM probes (nanoantennas) can be used to enhance and localize light at the nanometer scale area near the end of the tip. Such nanoantennas act as a “nano-source” of light giving possibility of optical imaging (Raman, fluorescence etc.) with nanometer scale resolution. Tip Enhanced Raman Spectroscopy (TERS) maps with spatial resolution reaching down to 10nm have been successfully obtained and reported using NT-MDT systems.
Scanning near-field optical microscopy (SNOM) is another approach to obtain optical images of optically active samples with resolution below diffraction limit.
The main features of the NTEGRA Spectra are:
The applications of the NTEGRA Spectra are:
Modes of operation:
AFM modes: contact AFM, LFM, resonant mode, phase imaging, MFM, EFM, adhesion force imaging, AFM lithography mode, force versus distance curves for adhesion, stifness and dissipation, spreading resistance Imaging, AFM litography – voltage, SCI (in air), scanning Kelvin probe microscopy (in air).
SNOM modes: SNOM fiber access to HV chamber for irradiation of sample close to cantilever probe of AFM Laser confocal measuring modes: scanning confocal Raman, scanning confocal fluorescence, scanning confocal laser microscopy, scanning confocal Raman at cryo temperatures.
Manufacturer`s Home page: http://www.ntmdt.com/